نوع مقاله : گزارش
نویسنده
تهران ، پژوهشگاه پلیمر و پتروشیمی ایران، صندوق پستی 112-14975
چکیده
کلیدواژهها
عنوان مقاله [English]
نویسنده [English]
An introduction to polymer structure and morphology will be followed by a brief review of the structural parameters that are commonly measured using X-ray scattering techniques. New measurement capabilities and their relevance for understanding the structural basis of performance will be discussed. Two techniques, microdiffraction and surface-enhanced scattering, two areas of investigation, crystallization kinetics and polymer deformation, and two examples
of analysis of data, complete analysis of 2-D wide-angle pattern and analysis of 2-D small-angle X-ray scattering patterns in elliptical coordinates will be highlighted to illustrate the recent developments in polymer X-ray diffraction.
کلیدواژهها [English]
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