An introduction to polymer structure and morphology will be followed by a brief review of the structural parameters that are commonly measured using X-ray scattering techniques. New measurement capabilities and their relevance for understanding the structural basis of performance will be discussed. Two techniques, microdiffraction and surface-enhanced scattering, two areas of investigation, crystallization kinetics and polymer deformation, and two examples of analysis of data, complete analysis of 2-D wide-angle pattern and analysis of 2-D small-angle X-ray scattering patterns in elliptical coordinates will be highlighted to illustrate the recent developments in polymer X-ray diffraction.
Bazaz Tolami, L. (2014). RECENT DEVELOPMENTS IN POLYMER CHARACTERIZATION
USING X-RAY DIFFRACTION. Basparesh, 4(1), 78–88. https://doi.org/10.22063/basparesh.2014.1063
MLA
Bazaz Tolami, L. "RECENT DEVELOPMENTS IN POLYMER CHARACTERIZATION
USING X-RAY DIFFRACTION", Basparesh, 4, 1, 2014, 78–88. doi: 10.22063/basparesh.2014.1063
HARVARD
Bazaz Tolami, L. (2014). 'RECENT DEVELOPMENTS IN POLYMER CHARACTERIZATION
USING X-RAY DIFFRACTION', Basparesh, 4(1), pp. 78–88. doi: 10.22063/basparesh.2014.1063
CHICAGO
Bazaz Tolami, L., "RECENT DEVELOPMENTS IN POLYMER CHARACTERIZATION
USING X-RAY DIFFRACTION." Basparesh, 4 1 (2014): 78–88, doi: 10.22063/basparesh.2014.1063
VANCOUVER
Bazaz Tolami L. RECENT DEVELOPMENTS IN POLYMER CHARACTERIZATION
USING X-RAY DIFFRACTION. Basparesh. 2014;4(1):78–88 (In Persian). doi: 10.22063/basparesh.2014.1063
